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Volumn 22, Issue 4, 1999, Pages 624-637

Warpage studies of HDI test vehicles during various thermal profiling

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; IMAGE ANALYSIS; INTERCONNECTION NETWORKS; MOIRE FRINGES; PRINTED CIRCUIT MANUFACTURE; SURFACE MOUNT TECHNOLOGY;

EID: 0033349070     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/6040.803455     Document Type: Article
Times cited : (19)

References (8)
  • 1
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    • PWB build-up technologies: Smaller, thinner and lighter, in
    • Anaheim, CA
    • H. Holden,PWB build-up technologies: Smaller, thinner and lighter, in Proc. NEPCON West '96, Anaheim, CA, 1996, vol. 3, pp. 1460-1468.
    • (1996) Proc. NEPCON West '96 , vol.3 , pp. 1460-1468
    • Holden, H.1
  • 2
    • 33749923393 scopus 로고    scopus 로고
    • 35 years of progress in electronics technology
    • Aug
    • S. Crum, 35 years of progress in electronics technology, Electron. Packag. Prod., pp. 53-58, Aug 1996.
    • (1996) Electron. Packag. Prod. , pp. 53-58
    • Crum, S.1
  • 3
    • 0029712081 scopus 로고    scopus 로고
    • Photodefined via PCB's breaking the design rules, in
    • Anaheim, CA
    • B. J. McDermott, Photodefined via PCB's breaking the design rules, in Proc. NEPCON West '96, Anaheim, CA, 1996, vol. 3, pp. 1480-1486.
    • (1996) Proc. NEPCON West '96 , vol.3 , pp. 1480-1486
    • McDermott, B.J.1
  • 4
    • 0032083804 scopus 로고    scopus 로고
    • On-line measurement of thermally induced warpage of BGA's with high sensitivity shadow Moiré
    • Y. Wang and P. Hassel, On-line measurement of thermally induced warpage of BGA's with high sensitivity shadow Moiré, Int. J. Microcirc. Electron. Packag., issue II, vol. 21, no. 2, 1998.
    • (1998) Int. J. Microcirc. Electron. Packag. , vol.21 , Issue.2 ISSUE II
    • Wang, Y.1    Hassel, P.2
  • 5
    • 0005468686 scopus 로고    scopus 로고
    • Measurement of thermally induced deformation of a BGA using phase-stepping shadow Moiré
    • _, Measurement of thermally induced deformation of a BGA using phase-stepping shadow Moiré, Exper./Numer. Mech. Electron. Packag., vol. 2, pp. 32-39, 1998.
    • (1998) Exper./Numer. Mech. Electron. Packag. , vol.2 , pp. 32-39
  • 6
    • 0031094653 scopus 로고    scopus 로고
    • System for real-time measurements of thermally induced warpage in a simulated infrared soldering environment
    • M. Stiteler and C. Ume, System for real-time measurements of thermally induced warpage in a simulated infrared soldering environment, ASMEJ. Electron. Packag., vol. 119, pp. 1-7, 1997.
    • (1997) ASMEJ. Electron. Packag. , vol.119 , pp. 1-7
    • Stiteler, M.1    Ume, C.2
  • 7
    • 0030408751 scopus 로고    scopus 로고
    • In-process board warpage measurement in a lab scale wave soldering oven
    • Dec.
    • M. Stiteler, C. Ume, and B. Leutz, In-process board warpage measurement in a lab scale wave soldering oven, IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 19, pp. 562-569, Dec. 1996.
    • (1996) IEEE Trans. Comp., Packag., Manufact. Technol. A , vol.19 , pp. 562-569
    • Stiteler, M.1    Ume, C.2    Leutz, B.3
  • 8
    • 0003710062 scopus 로고
    • A. Kobayashi, Ed., Englewood Cliffs, NJ: Prentice-Hall
    • A. Kobayashi, Ed., Handbook on Experimental Mechanics. , Englewood Cliffs, NJ: Prentice-Hall, 1987, pp. 282-313.
    • (1987) Handbook on Experimental Mechanics. , pp. 282-313


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.