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Volumn 27, Issue 1, 1999, Pages 119-126

LIMM: a technique for determination of the spatial distribution of the spontaneous polarization in ferroelectric thin films

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; FATIGUE OF MATERIALS; FERROELECTRIC MATERIALS; INTEGRAL EQUATIONS; LASER BEAMS; NEURAL NETWORKS; POLARIZATION; PYROELECTRICITY; RANDOM ACCESS STORAGE;

EID: 0033345906     PISSN: 10584587     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1080/10584589908228461     Document Type: Article
Times cited : (9)

References (12)
  • 8
    • 0003610466 scopus 로고    scopus 로고
    • Wolfram Research, Inc., Champaign, IL
    • Mathematica 3.0 (Wolfram Research, Inc., Champaign, IL, 1996).
    • (1996) Mathematica 3.0
  • 12
    • 85037965387 scopus 로고    scopus 로고
    • CorMac Technologies, Thunder Bay, Ontario, Canada
    • NeuNet Pro 2.01 (CorMac Technologies, Thunder Bay, Ontario, Canada, 1998).
    • (1998) NeuNet Pro 2.01


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.