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Volumn 546, Issue , 1999, Pages 69-74

Etch selectivity of novel epitaxial layers for bulk micromachining

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DIFFUSION IN SOLIDS; ETCHING; PRECIPITATION (CHEMICAL); SEMICONDUCTING BORON; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING; SUBSTRATES;

EID: 0033341249     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (11)
  • 1
    • 33751125924 scopus 로고
    • A Bulk Silicon Dissolved Wafer Process for Microelectromechanical Sensors
    • Washington DC
    • Y. Gianchandani and K. Najafi, "A Bulk Silicon Dissolved Wafer Process for Microelectromechanical Sensors," Tech. Dig. IEDM, Washington DC, 1991,2951.
    • (1991) Tech. Dig. IEDM , pp. 2951
    • Gianchandani, Y.1    Najafi, K.2
  • 2
    • 0029419213 scopus 로고
    • A Batch Dissolved Wafer Process for Low Cost Sensor Applications
    • S.T. Cho, "A Batch Dissolved Wafer Process for Low Cost Sensor Applications," SPIE Vol. 2639 (1995) 10.
    • (1995) SPIE , vol.2639 , pp. 10
    • Cho, S.T.1
  • 6
    • 33751124329 scopus 로고    scopus 로고
    • Yield Enhancement in Micromechanical Sensor Fabrication using Statistical Process Control
    • J.T. Borenstein and D.M. Preble, "Yield Enhancement in Micromechanical Sensor Fabrication using Statistical Process Control", SPIE Vol. 3223, 1997, p. 276.
    • (1997) , SPIE , vol.3223 , pp. 276
    • Borenstein, J.T.1    Preble, D.M.2
  • 7
    • 0030682257 scopus 로고    scopus 로고
    • Structural Characterization of P-HSi:B Layers for Bulk Micromachining
    • K.C. Wu, P.A. Shay, J.T. Borenstein and E.A. Fitzgerald, "Structural Characterization of P-HSi:B Layers for Bulk Micromachining," MRS Symp. Vol. 444 (1997) 197.
    • (1997) MRS Symp. , vol.444 , pp. 197
    • Wu, K.C.1    Shay, P.A.2    Borenstein, J.T.3    Fitzgerald, E.A.4
  • 9
    • 0030403258 scopus 로고    scopus 로고
    • Characterization of Membrane Curvature in Micromechanical Silicon Accelerometers and Gyroscopes Using Optical Interferometry
    • J. T. Borenstein, P. Greiff, J.B. Sohn and M.S. Weinberg, "Characterization of Membrane Curvature in Micromechanical Silicon Accelerometers and Gyroscopes Using Optical Interferometry", SPIE Vol. 2879, 1996, 116.
    • (1996) SPIE , vol.2879 , pp. 116
    • Borenstein, J.T.1    Greiff, P.2    Sohn, J.B.3    Weinberg, M.S.4
  • 10
    • 0025519505 scopus 로고
    • Anisotropie Etching of Crystalline Silicon in Alkaline Solutions: Ü. Influence of Dopants
    • H. Seidel, L. Csepregi, A. Heuberger and H. Baumgärtel, "Anisotropie Etching of Crystalline Silicon in Alkaline Solutions: Ü. Influence of Dopants," J. Electrochem. Soc., 137 (1990) 3626.
    • (1990) J. Electrochem. Soc. , vol.137 , pp. 3626
    • Seidel, H.1    Csepregi, L.2    Heuberger, A.3    Baumgärtel, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.