Current noise of trimmed thick-film resistors: Measurement and simulation

Microelectronics International

Volumn 15, Issue 1, 1998, Pages 15-22

  Raab, Achim ^a   Jung, Christian ^a   Dullenkopf, Peter ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 13144293131     PISSN: 13565362     EISSN: None     Source Type: Journal    
DOI: 10.1108/13565369810199077     Document Type: Article

References (7)

1. Cramer, S. ( 1995 ), "Ein Beitrag zur Rauschmesstechnik an elektronischen Bauelementen und Verstärkern im Frequenzbereich von 10 mHz bis 10 MHz", Dissertation. Ruhr-Universität Bochum.
2. Dullenkopf, P., Cramer, S. and Raab, A. (1995), "Rauschmessungen an Dickschichtwiderständen bei niedrigen Frequenzen", Deutsche ISHM Konferenz.
3. Postlethwaite, P. (1984), "CAD simulations improve resistor trimming results", Circuits Manufacturing, pp. 100-05.
4. Prudenziati, M. and dell'Acqua, R. (1994), "Thick-film resistors", in Prudenziati, M. (Ed.), Handbook of Sensors and Actuators, Elsevier Science, Amsterdam, pp. 85-97.
5. Reichl, H. (1986). Technologie und Entwurf von Dickschichtschaltungen, Hüthig Verlag GmbH, Heidelberg.
6. Roesner, R. and Witte. W. (1989), "1/f noise and post trim stability of laser trimmed thick-film resistors", Proceedings of the 1989 International Symposium on Microelectronics, pp. 175-7.
7. Vandamme, L.K.J. (1977), "Criteria of low-noise thick-film resistors", Proceedings of the European Hybrid Microelectronic Conference, Bad Homburg, pp. XXIV; 1-8.