Defect-engineering rad-hard particle detectors: The role of impurities and inter-defect charge exchange

Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 1045-1049

  MacEvoy, B C ^a   Santocchia, A ^a   Hall, G ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COLLIDING BEAM ACCELERATORS; CRYSTAL DEFECTS; MATHEMATICAL MODELS; RADIATION HARDENING; SILICON SENSORS;

DEFECT ENGINEERING; SILICON DETECTORS;

PARTICLE DETECTORS;

EID: 0033330156     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00635-3     Document Type: Article

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