Suppression of the tunneling effect by shallow junctions in field-effect transistor

Superlattices and Microstructures

Volumn 26, Issue 5, 1999, Pages 289-297

  Fu, Y ^a   Willander, M ^a  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; FUNCTIONS; TUNNEL JUNCTIONS;

QUANTUM WAVE TRANSPORT; WAVEFUNCTIONS;

FIELD EFFECT TRANSISTORS;

EID: 0033324153     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1999.0780     Document Type: Article

References (11)

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