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Volumn 205, Issue 4, 1999, Pages 489-496

Effects of increased growth rate of well layer on 2.1% compressive strained InAsP-MQWs grown by metalorganic molecular beam epitaxy (MOMBE)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; DEGRADATION; EPITAXIAL GROWTH; HETEROJUNCTIONS; METALLORGANIC VAPOR PHASE EPITAXY; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR LASERS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0033322348     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00297-3     Document Type: Article
Times cited : (6)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.