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Volumn 205, Issue 4, 1999, Pages 489-496
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Effects of increased growth rate of well layer on 2.1% compressive strained InAsP-MQWs grown by metalorganic molecular beam epitaxy (MOMBE)
a
NTT CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPRESSIVE STRESS;
DEGRADATION;
EPITAXIAL GROWTH;
HETEROJUNCTIONS;
METALLORGANIC VAPOR PHASE EPITAXY;
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR LASERS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
COMPRESSIVE STRAIN;
GROWTH RATE;
METALORGANIC MOLECULAR BEAM EPITAXY;
MULTIQUANTUM WELLS;
SURFACE UNDULATION;
SEMICONDUCTOR QUANTUM WELLS;
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EID: 0033322348
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(99)00297-3 Document Type: Article |
Times cited : (6)
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References (17)
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