Influence of net strain, strain type, and temperature on the critical thickness of In(Ga)AsP-strained multi quantum wells

Journal of Applied Physics

Volumn 84, Issue 9, 1998, Pages 4775-4780

  Ogasawara, Matsuyuki ^a   Sugiura, Hideo ^a   Mitsuhara, Manabu ^a   Yamamoto, Mitsuo ^a   Nakao, Masashi ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000483128     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368719     Document Type: Article

References (21)

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