Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy

Surface and Interface Analysis

Volumn 27, Issue 3, 1999, Pages 142-152

  Henneuse Boxus, Catherine ^a   Poleunis, Claude ^b   De Ro, Astrid ^b   Adriaensen, Yasmine ^b   Bertrand, Patrick ^b   Marchand Brynaert, Jacqueline ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b Bâtiment Lavoisier ^*

Author keywords

[No Author keywords available]

Indexed keywords

POLYETHER ETHER KETONES; SECONDARY ION MASS SPECTROMETRY; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

POLYETHER ETHER KETONE FILM; SURFACE WET CHEMISTRY;

PLASTIC FILMS;

EID: 0033298024     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199903)27:3<142::AID-SIA493>3.0.CO;2-6     Document Type: Article

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