A general parameter-extraction method for transistor noise models

IEEE Transactions on Microwave Theory and Techniques

Volumn 47, Issue 12, 1999, Pages 2358-2363

  Stenarson, Jörgen ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

OPTIMIZATION; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE;

NODAL ANALYSIS; POSPIESZALSKI MODELS;

MESFET DEVICES;

EID: 0033281708     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.808982     Document Type: Article

References (12)

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