Progress report on the development of microwave spectral references at the LPMO

EPJ Applied Physics

Volumn 8, Issue 3, 1999, Pages 269-274

  Giordano, V ^a   Kersale Y ^a   Di Monaco, O ^a   Chaubet, M ^b  

^a Lab Phys Metrologie Oscillateurs   (France)

^b CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CRYSTAL RESONATORS; DIELECTRIC LOSSES; ELECTROMAGNETIC FIELDS; FREQUENCY STABILITY; LIGHT REFLECTION; SAPPHIRE; SINGLE CRYSTALS;

MICROWAVE SPECTRAL REFERENCES;

MICROWAVE OSCILLATORS;

EID: 0033281449     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:1999256     Document Type: Article

References (26)

1. V.B. Braginsky, V.S.H. Chenko, K.S. Bagdassarov, Phys. Lett. A 120, 300 (1987).
2. es Journées Nationales Micro-ondes, St-Malo, France, 1997, pp. 128-129.
3. c Congrès International de Métrologie, Besançon, France, 1997, pp. 303-306.
4. G. J. Dick, Proceedings of Precise Time and Time Interval, Redendo Beach (USA), 1987, p. 133-147.
5. G. Santarelli, C. Audoin, A. Makdissi, P. Laurent, G.J. Dick, A. Clairon, IEEE Trans. UFFC 45, 887 (1998).
6. C. Salomon, P. Laurent, P. Lemonde, E. Simon, G. Santarelli, A. Clairon, N. Dimarcq, C. Audoin, P. Petit, L. Bernier, G. Busca, E. Samain, Proceedings of the EFTF/FCS Joint Meeting, Besançon, France, 1999.
7. es Journées Nationales Microondes, St-Malo France, 1997, pp. 244-245.
8. es Journées Nationales Microondes, St-Malo France, 1997, pp. 264-265.
9. X.H. Jiao, P. Guillon, L.A. Bermudez, IEE Proceedings 134, 497 (1987).
10. E.N. Ivanov, D.G. Blair, V.I. Kalinichev, IEEE Trans. MTT 41, 632 (1993).
11. O. di Monaco, W. Daniau, I. Lajoie, Y. Gruson, M. Chaubet, V. Giordano, Electron. Lett. 32, 669 (1996).
12. F. Schmid, D.J. Viechnicki, Solid State Technol. 9, (1973).
13. O. di Monaco, Ph.D. thesis, Université de Franche-Comté, Besançon, France, 1997.
14. J. Rutman, Proc. IEEE 66, 1048 (1978).
15. F.L. Walls, E.S. Ferre-Pikal, S.R. Jefferts, IEEE Trans. UFFC 44, 326 (1997).
16. D.B. Leeson, Proc. IEEE 54, 329 (1966).
17. Y. Kersalé, F. Ladret-Vieudrin, M. Chaubet, V. Giordano, Electron. Lett. 34, 783 (1998).
18. A.N. Luiten, A.G. Mann, M.E. Costa, D.G. Blair, IEEE Trans. IM 44, 132 (1995).
19. G.J. Dick, R.T. Wang, R.L. Tjoelker, Proceedings of the IEEE International Frequency Control Symposium, Pasadena (USA), 1998, pp. 528-533.
20. M.E. Tobar, J. Krupka, J.G. Hartnett, E.N. Ivanov, R.A. Woode, IEEE Trans. UFFC 45, 830 (1998).
21. J.G. Hartnett, M.E. Tobar, A.G. Mann, J. Krupka, E.N. Ivanov, Electron. Lett. 34, 195 (1998).
22. G.J. Dick, D.G. Santiago, R.T. Wang, Proceedings of the IEEE International Frequency Control Symposium, Boston (USA), 1994, pp. 421-432.
23. S. Pérez, D. Floriot, P. Maurin, P. Bouquet, P.M. Guttiérrez, J. Obregon, S.L. Delage, Electron. Lett. 34, 813 (1998).
24. B. van Haaren, M. Régis, O. Lloppis, L. Escotte, A. Gruhle, C. Mähner, R. Plana, J. Graffeuil, IEEE Trans. MTT 46, 647 (1998).
25. E.N. Ivanov, M.E. Tobar, R.A. Woode, IEEE Trans. MTT 46, 1537 (1998).
26. E. Rubiola, V. Giordano, J. Groslambert, Rev. Sci. Instrum. 70, 220 (1999).