Nyquist rate pixel level ADC for CMOS image sensors

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1998, Pages 237-240

  Yang, David X D ^a   Fowler, Boyd ^a   El Gamal, Abbas ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; DIGITAL TO ANALOG CONVERSION; IMAGE SENSORS;

MULTI-CHANNEL BIT SERIAL (MCBS) CONVERTERS; NYQUIST RATE PIXELS;

ANALOG TO DIGITAL CONVERSION;

EID: 0031621169     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)