The structure and degradation mechanism of SrBi2Ta2O6 thin films

Journal of the Korean Physical Society

Volumn 35, Issue SUPPL. 5, 1999, Pages

  Kim, HongKeun ^a   Bae, SangBo ^a   Kim, JinWoo ^a   Kim, TaeSoo ^a   Kim, IllWon ^a   Lee, HeaYeon ^b   Jeong, JungHyun ^b  

^a University of Ulsan   (South Korea)

^b Pukyong National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033271086     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

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