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Volumn 6, Issue 6, 1999, Pages 1097-1102

Structure of Si(001)-(4 × 3)-In surface studied by X-ray photoelectron diffraction

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Indexed keywords


EID: 0033261860     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X99001219     Document Type: Article
Times cited : (17)

References (18)
  • 16
    • 0007925896 scopus 로고
    • X. Chen, T. Abukawa, J. Tani and S. Kono, Phys. Rev. B52, 12380 (1995); Surf. Rev. Lett. 2, 795 (1995).
    • (1995) Surf. Rev. Lett. , vol.2 , pp. 795


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.