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Volumn 33, Issue 11, 1999, Pages 1188-1192

Deep-level transient spectroscopy of radiation-induced levels in 6H-SiC

(1) Ballandovich, V S a

a SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033229601 PISSN: 10637826 EISSN: None Source Type: Journal
DOI: 10.1134/1.1187846 Document Type: Article

Times cited : (18)

References (15)

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