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Volumn 35, Issue 24, 1999, Pages 2145-2146
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Low interface state density AlN/GaN MISFETs
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
EPITAXIAL GROWTH;
HETEROJUNCTIONS;
INTEGRATED CIRCUIT MANUFACTURE;
INTERFACES (MATERIALS);
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM COMPOUNDS;
TRANSCONDUCTANCE;
STATE DENSITY;
TERMAN METHOD;
MISFET DEVICES;
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EID: 0033221741
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19991407 Document Type: Article |
Times cited : (63)
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References (7)
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