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Volumn 35, Issue 24, 1999, Pages 2145-2146

Low interface state density AlN/GaN MISFETs

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; EPITAXIAL GROWTH; HETEROJUNCTIONS; INTEGRATED CIRCUIT MANUFACTURE; INTERFACES (MATERIALS); SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; TRANSCONDUCTANCE;

EID: 0033221741     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19991407     Document Type: Article
Times cited : (63)

References (7)
  • 1
    • 0032668826 scopus 로고    scopus 로고
    • High power microwave GaN/A1GaN HEMTs on semi-insulating silicon carbide substrates
    • SHEPPARD, T.S.: 'High power microwave GaN/A1GaN HEMTs on semi-insulating silicon carbide substrates', IEEE Electron Device Lett., 1999, 20, (4), pp. 161-163
    • (1999) IEEE Electron Device Lett. , vol.20 , Issue.4 , pp. 161-163
    • Sheppard, T.S.1
  • 2
    • 0004976568 scopus 로고    scopus 로고
    • GaN materials for high power microwave amplifiers
    • 13-15 April
    • EASTMAN, L.: 'GaN materials for high power microwave amplifiers', Proc. MRS Spring Meeting, 13-15 April 1998, pp. 3-7
    • (1998) Proc. MRS Spring Meeting , pp. 3-7
    • EASTMAN, L.1
  • 3
    • 0031223714 scopus 로고    scopus 로고
    • 0.5N/GaN MODFETs with power density > 3W/mm at 18GHz
    • 0.5N/GaN MODFETs with power density > 3W/mm at 18GHz', Electron. Lett., 1997, 33, (20). pp. 1742-1743
    • (1997) Electron. Lett. , vol.33 , Issue.20 , pp. 1742-1743
    • Wu, Y.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.