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Volumn 35, Issue 5 PART 1, 1999, Pages 2829-2831

Demonstration of a four state sensing scheme for a single pseudo-spin valve gmr bit

Author keywords

Comparator; Four state logic; GMR; MRAM; Sense amplifier

Indexed keywords

MAGNETIZATION; MAGNETORESISTANCE; RANDOM ACCESS STORAGE; THERMAL EFFECTS;

EID: 0033184128     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800994     Document Type: Article
Times cited : (17)

References (8)
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    • IEEE Trans. Magn.
    • Pohm, A.V.1    Daughton, J.M.2    Brown, J.3    Beech, R.4
  • 3
    • 0031220332 scopus 로고    scopus 로고
    • "Field Programmable Logic Gates Using GMR Devices,"
    • vol. 33, no. 5, pp. 3307-3309, September 1997.
    • M. M. Hassoun, W. C. Black, E. K. F. Lee, R. L. Geiger, and A. Hurst. "Field Programmable Logic Gates Using GMR Devices," IEEE Trans. Magn., vol. 33, no. 5, pp. 3307-3309, September 1997.
    • IEEE Trans. Magn.
    • Hassoun, M.M.1    Black, W.C.2    Lee, E.K.F.3    Geiger, R.L.4    Hurst, A.5
  • 4
    • 0005048459 scopus 로고    scopus 로고
    • Quaternary giant magnetoresistance random access memory,"
    • 79, 6639-6641, April 1996.
    • Z. Wang and Y. Nakamura Quaternary giant magnetoresistance random access memory," J. Appl. Phys., 79, 6639-6641, April 1996.
    • J. Appl. Phys.
    • Wang, Z.1    Nakamura, Y.2
  • 5
    • 33748012877 scopus 로고    scopus 로고
    • Method for detecting information stored in a MRAM cell having two magnetic layers in different thicknesses,"
    • 5,703,805, December 1997.
    • S. N.Tehrani, E. Chen, M. Durlam, and X. T. Zhu Method for detecting information stored in a MRAM cell having two magnetic layers in different thicknesses," US patent No.5,703,805, December 1997.
    • US Patent No.
    • Ntehrani, S.1    Chen, E.2    Durlam, M.3    Zhu, X.T.4
  • 7
    • 0026996006 scopus 로고    scopus 로고
    • Design Techniques for High-Speed, High-Resolution Comparators,"
    • 27, No.12, December 1992.
    • B. Razavi, and B. A. Wooley Design Techniques for High-Speed, High-Resolution Comparators," IEEE Journal of Solid-State Circuits, vol.27, No.12, December 1992.
    • IEEE Journal of Solid-State Circuits, Vol.
    • Razavi, B.1    Wooley, B.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.