An accurate measurement of magnetostriction of thin films by using nano-indentation system

IEEE Transactions on Magnetics

Volumn 35, Issue 5 PART 2, 1999, Pages 3832-3834

  Shima, Toshiyuki ^a   Fujimori, Hiroyasu ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Magnetostriction measurement; Nano indentation system; Thin films; Young's modulus

Indexed keywords

ELASTIC MODULI; ELASTICITY; MAGNETIC VARIABLES MEASUREMENT; MAGNETOSTRICTION;

NANO-INDENTATION SYSTEMS;

MAGNETIC THIN FILMS;

EID: 0033184012     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800680     Document Type: Article

References (7)

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