Precise measurements of a magnetostriction coefficient of a thin soft-magnetic film deposited on a substrate

Journal of Applied Physics

Volumn 64, Issue 10, 1988, Pages 5422-5424

  Tam, A C ^a   Schroeder, H ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038210054     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.342358     Document Type: Article

References (8)

1. Magnetic Sensing with Magnetostrictive Materials Using a Tunneling Detector