Measurement of Very Low Magnetostrictions in Thin Films

IEEE Transactions on Magnetics

Volumn 31, Issue 6, 1995, Pages 3391-3393

  Rengarajan, S ^a   Lee, B H ^a   Choe, G ^a   Walser, R M ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; IMAGING TECHNIQUES; INTERFEROMETERS; LASER APPLICATIONS; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETIC THIN FILMS; MAGNETIC VARIABLES MEASUREMENT; OPTICAL RESOLVING POWER;

CANTILEVER BEAM TECHNIQUE; HIGH DISPLACEMENT RESOLUTION; LASE HETERODYNE INTERFEROMETER;

MAGNETOSTRICTION;

EID: 0029406043     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.490392     Document Type: Article

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