An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 345-350

  Boneberg, J ^a   Ochmann, M ^a   Munzer H J ^a   Leiderer, P ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

NFOM; Spectroscopy in NFOM

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSCOPES; PHASE MEASUREMENT; REFLECTION; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY;

ATTENUATED TOTAL REFLECTION GEOMETRY; SCANNING PLASMON NEAR FIELD MICROSCOPY;

OPTICAL MICROSCOPY;

ARTICLE; LIGHT; MICROSCOPY; OPTICS; POLARIZATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SPECTROSCOPY;

EID: 0032033856     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00064-8     Document Type: Article

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