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Volumn 9, Issue 1, 1999, Pages 58-63

Ultra-deep LIGA process

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; IRRADIATION; LOW TEMPERATURE OPERATIONS; MASKS; MICROELECTRONIC PROCESSING; PHOTORESISTS; RESIDUAL STRESSES; SUBSTRATES; THERMAL EXPANSION; THERMAL STRESS; X RAYS;

EID: 0033100796     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/9/1/307     Document Type: Article
Times cited : (37)

References (19)
  • 1
    • 0344300487 scopus 로고    scopus 로고
    • LIGA activity in Taiwan
    • Cheng Y 1996 LIGA activity in Taiwan Microsyst. Technol. 2 157-61
    • (1996) Microsyst. Technol. , vol.2 , pp. 157-161
    • Cheng, Y.1
  • 3
    • 0031382524 scopus 로고    scopus 로고
    • Calculation and experimental determination of the structure transfer accuracy in deep X-ray lithography
    • Feiertag G, Ehrfeld W, Lehr H, Schmidt A and Schmidt M 1997 Calculation and experimental determination of the structure transfer accuracy in deep x-ray lithography J. Micromech. Microeng. 7 323-31
    • (1997) J. Micromech. Microeng. , vol.7 , pp. 323-331
    • Feiertag, G.1    Ehrfeld, W.2    Lehr, H.3    Schmidt, A.4    Schmidt, M.5
  • 8
    • 0028755470 scopus 로고
    • Super resolution lithography using a direct write laser pattern generator
    • Wijnaendts-van-Resandt R W and Buchner C 1994 Super resolution lithography using a direct write laser pattern generator Proc. SPIE 2213 18-23
    • (1994) Proc. SPIE , vol.2213 , pp. 18-23
    • Wijnaendts-Van-Resandt, R.W.1    Buchner, C.2
  • 12
    • 0345162995 scopus 로고    scopus 로고
    • Photoresist development modeling based on continuity eqations
    • Zhu Y, Gapodieci L and Cerrina F 1997 Photoresist development modeling based on continuity eqations Proc. SPIE 3049 201-11
    • (1997) Proc. SPIE , vol.3049 , pp. 201-211
    • Zhu, Y.1    Gapodieci, L.2    Cerrina, F.3
  • 13
    • 0009145773 scopus 로고    scopus 로고
    • Structure changes in poly(methyl methacrylate) during deep-etch X-ray synchrotron radiation lithography
    • Schmalz O, Hess M and Kosfeld R 1996 Structure changes in poly(methyl methacrylate) during deep-etch x-ray synchrotron radiation lithography Angew. Makromol. Chem. 239 93-106
    • (1996) Angew. Makromol. Chem. , vol.239 , pp. 93-106
    • Schmalz, O.1    Hess, M.2    Kosfeld, R.3
  • 14
    • 0031070208 scopus 로고    scopus 로고
    • Development behaviour of irradiated microstructures
    • Zanghellini J, El-Kholi A and Mohr J 1997 Development behaviour of irradiated microstructures Microelectron. Eng. 35 409-12
    • (1997) Microelectron. Eng. , vol.35 , pp. 409-412
    • Zanghellini, J.1    El-Kholi, A.2    Mohr, J.3
  • 17
    • 0000381510 scopus 로고
    • X-ray monochromators and mirrors
    • (Amsterdam: North-Holland-Elsevier) ch 4
    • Batterman B W and Bilderback D H 1991 X-ray monochromators and mirrors Handbook on Synchrotron Radiation vol 3 (Amsterdam: North-Holland-Elsevier) ch 4, 105-53
    • (1991) Handbook on Synchrotron Radiation , vol.3 , pp. 105-153
    • Batterman, B.W.1    Bilderback, D.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.