Recent development in quantitative electron diffraction for crystallography of materials

Materials Transactions, JIM

Volumn 39, Issue 9, 1998, Pages 927-937

  Tomokiyo, Yoshitsugu ^a   Matsumura, Syo ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTALLOGRAPHY; LATTICE CONSTANTS; MATERIALS SCIENCE; TERNARY SYSTEMS;

CONVERGENT-BEAM ELECTRON DIFFRACTION (CBED); CRITICAL VOLTAGE EFFECT; ENERGY FILTERING; INTERSECTING KIKUCHI LINE METHOD;

ELECTRON DIFFRACTION;

EID: 0032156217     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.39.927     Document Type: Review

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