Atomic force microscope studies of membranes: Force measurement and imaging in electrolyte solutions

Journal of Membrane Science

Volumn 126, Issue 1, 1997, Pages 77-89

  Bowen, W Richard ^a   Hilal, Nidal ^a   Lovitt, Robert W ^a   Sharif, Adel O ^a   Williams, Peter M ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Atomic force microscopy; Electrical double layer; Microfiltration; Pore size distribution; Surface forces; Ultrafiltration

Indexed keywords

ELECTROLYTE; POLYMER; SILICON; SODIUM CHLORIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; FORCE; IMAGE ANALYSIS; IONIC STRENGTH; MEMBRANE FILTER; MICROFILTRATION; PRIORITY JOURNAL; ULTRAFILTRATION;

ATOMIC FORCE MICROSCOPY; ELECTROLYTES; FORCE MEASUREMENT; IMAGE ANALYSIS; IONIC STRENGTH; POROUS MATERIALS; SODIUM CHLORIDE; SOLUTIONS; ULTRAFILTRATION;

ELECTRIC DOUBLE LAYER REPULSIVE FORCES; MICROFILTRATION; SURFACE FORCES;

POLYMERIC MEMBRANES;

ELECTROLYTES; IMAGING TECHNIQUES; MEMBRANES; MICROFILTRATION; ULTRAFILTRATION;

EID: 0030615428     PISSN: 03767388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0376-7388(96)00275-X     Document Type: Article

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