Special feature: Tutorial. Coincidence measurements in mass spectrometry

Journal of Mass Spectrometry

Volumn 32, Issue 11, 1997, Pages 1151-1161

  Van Stipdonk, M J ^a,b   Schweikert, E A ^a   Park, M A ^a,c  

^a TEXAS A AND M UNIVERSITY   (United States)

^b Ionwerks   (United States)

^c Bruker Instruments Inc   (United States)

Author keywords

Coincidence measurements; Ion production from solids; Microhomogeneity of surfaces; Polyatomic ions

Indexed keywords

ARTICLE; COMPUTER PROGRAM; IONIZATION; MASS SPECTROMETRY; PRIORITY JOURNAL; TECHNIQUE;

EID: 0030669837     PISSN: 10765174     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9888(199711)32:11<1151::AID-JMS605>3.0.CO;2-1     Document Type: Article

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