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Volumn 8, Issue 19, 1996, Pages 3323-3336
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Multiple-scattering calculations for SiO2 polymorphs: A comparison to ELNES and XANES spectra
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
ATOMS;
CALCULATIONS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON SCATTERING;
ELECTRONIC STRUCTURE;
X RAY SPECTROSCOPY;
CLUSTER SIZES;
ELECTRON ENERGY LOSS NEAR EDGE STRUCTURE;
MULTIPLE SCATTERING CALCULATIONS;
POLYMORPHS;
X RAY ABSORPTION NEAR EDGE STRUCTURE;
SILICA;
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EID: 0030572072
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/8/19/008 Document Type: Article |
Times cited : (33)
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References (44)
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