EXELFS χ-data renormalization

Ultramicroscopy

Volumn 68, Issue 3, 1997, Pages 163-171

  Qian, Maoxu ^a   Sarikaya, Mehmet ^a   Stern, Edward A ^b  

^a University of Washington   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

data; Debye Waller factor; Electron energy loss spectroscopy (EELS); Extended energy loss fine structure (EXELFS) spectroscopy; Near neighbor; Transmission electron microscopy (TEM); X ray absorption fine structure (XAFS) analysis

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; DATA REDUCTION; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

DATA RENORMALIZATION; DEBYE WALLER FACTOR; EXTENDED ENERGY LOSS FINE STRUCTURE (EXELFS) SPECTROSCOPY; X RAY ABSORPTION FINE STRUCTURE (XAFS) ANALYSIS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; DATA ANALYSIS; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; MATHEMATICAL MODEL; MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY MICROANALYSIS;

EID: 0031194669     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00021-1     Document Type: Article

References (18)

1. M. Sarikaya, M. Qian, E.A. Stern, EXELFS revisited. A review paper, Micron, to appear.
2. E.A. Stern, W.M. Heald, in: Handbook on Synchrotron Radiation, vol. 1, ch. 10, North-Holland, New York, 1983.
3. R.D. Leapman, V.E. Cosslett, J. Phys. D 9 (1976) L.29.
4. S. Csillag, D.E. Johnson, E.A. Stern, in: B.K. Teo, D.C. Joy (Eds.), EXAFS Spectroscopy Techniques and Applications, Plenum, New York, 1981, pp. 241-254.
5. M.M. Disko, C.C. Ahn, G. Meitzner, O.L. Krivanek, in: Microbeam Analysis, San Francisco Press, San Francisco, 1988, pp. 47-49.
6. G. Hug, C.L. Phan, G. Slanche, Mat. Sci. Eng. A 192-A 193 (1995) 673.
7. E.A. Stern, M. Qian, M. Sarikaya, in: M. Sarikaya, M. Isaacson and K. Wichramasinghe (Eds.), Determining Nanoscale Properties of Materials by Microscopy and Spectroscopy, MRS Symp. Proc., vol. 332, Materials Research Society, Pittsburgh, PA, 1994, pp. 3-14.
8. M. Qian, M. Sarikaya, E.A. Stern, Ultramicroscopy 59 (1995) 137.
9. M. Sarikaya et al., The copyrighted UWEXELFS 1.0 software.
10. E.A. Stern et al., The copyrighted UWXAFS 3.0 software.
11. E.A. Stern, Optik 61 (1982) 45.
12. W.H. McMaster, N. Kerr Del Grande, J.H. Mallett, J.H. Hubbell, Lawrence Radiation Laboratory UCRI-50174, Section II, 1969.
13. R.F. Egerton, Electron Energy Loss Spectroscopy in the Electron Microscope, 2nd ed., Plenum Press, New York, 1996.
14. R.F. Egerton, S.C. Cheng, Ultramicroscopy 55 (1994) 43.
15. O.L. Krivanek, C.C. Ahn, R.B. Keeney, Ultramicroscopy 22 (1987) 103.
16. M. Kundman, Instructions for EELS Acquisition, GATAN, Pleasanton, CA, 1993.
17. P. Lagarde, unpublished, 1992.
18. L. Tröger et al., Phys. Rev. B 46 (1992) 3283.