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Volumn 30, Issue 5, 1999, Pages 449-461

Roles for electron microscopy in establishing structure-property relationships for high T(c) superconductor grain boundaries

Author keywords

Bi2Sr2Ca1Cu2O(8+x); Bicrystals; EDS; EELS; Grain boundaries; High T(c) superconductors; TEM; YBa2Cu3O(7 )

Indexed keywords


EID: 0032717194     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00046-3     Document Type: Article
Times cited : (13)

References (46)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.