Electromagnetic and microstructural investigations of a naturally grown 8° [001] tilt bicrystal of Bi2Sr2CaCu2O8+x

Journal of Materials Research

Volumn 11, Issue 4, 1996, Pages 868-877

  Wang, Jyh Lih ^a   Tsu, I Fei ^a   Cai, X Y ^a   Kelley, R J ^a   Vaudin, M D ^b   Babcock, S E ^a   Larbalestier, D C ^a  

^a University of Wisconsin Madison   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CURRENT VOLTAGE CHARACTERISTICS; DISLOCATIONS (CRYSTALS); ELECTRIC RESISTANCE; ELECTROMAGNETISM; GRAIN BOUNDARIES; OXIDE SUPERCONDUCTORS; SUPERCONDUCTING TRANSITION TEMPERATURE;

BISMUTH STRONTIUM CALCIUM COPPER OXIDE; IRREVERSIBILITY FIELDS; TILT BICRYSTAL;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0030128375     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.1996.0108     Document Type: Article

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