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Volumn 11, Issue 6, 1996, Pages 1383-1397

Faceting, dislocation network structure, and various scales of heterogeneity in a YBa2Cu3O7-δ low-angle [001] tilt boundary

(3) Tsu, I Fei a Babcock, S E a Kaiser, D L b

a UNIVERSITY OF WISCONSIN MADISON (United States)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

DISLOCATION NETWORK STRUCTURE; FACET JUNCTIONS; FACETING; GRAIN BOUNDARY TOPOGRAPHY; LOW ANGLE TILT BOUNDARY; NANOMETER; STRUCTURAL HETEROGENEITY; YTTRIUM BARIUM CUPRATES;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0030172110 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.1996.0174 Document Type: Article

Times cited : (41)

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