Characterization of grain boundaries in YBa2Cu3Oy bicrystal junctions

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3101-3104

  Yu Hsiao Wen, ^a   Chen, Ming Jye ^a   Yang, Hong Chang ^a   Yang, S Y ^a   Horng, H E ^b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; GRAIN BOUNDARIES; MICROSTRUCTURE; MORPHOLOGY; SURFACES; YTTRIUM BARIUM COPPER OXIDES;

GRAIN BOUNDARY CONDITIONS; SHAPIRO STEPS; YTTRIUM BARIUM COPPER OXIDE BICRYSTAL JUNCTIONS;

JOSEPHSON JUNCTION DEVICES;

EID: 0032683859     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783685     Document Type: Article

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