Nondestructive investigation of microstructures and defects at a SrTiO3 bicrystal boundary

Applied Physics Letters

Volumn 72, Issue 25, 1998, Pages 3365-3367

  Jiang, Q D ^a   Huang, Z J ^a   Brazdeikis, A ^a   Dezaneti, M ^a   Chen, C L ^a   Jin, P ^a   Chu, C W ^a  

^a University of Houston   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0141835417     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121605     Document Type: Article

References (15)

1. R. Gross, P. Chaudhari, M. Kawasaki, M. B. Betchen, and A. Gupta, Appl. Phys. Lett. 57, 727 (1990).
2. Z. Ivanov, P. Å. Nilsson, D. Winkler, J. A. Alarco, and T. Claeson, Appl. Phys. Lett. 59, 3030 (1991).
3. Y. Q. Shen, Z. J. Sun, R. Kromann, T. Holst, P. Vase, and T. Freloft, Appl. Phys. Lett. 67, 2081 (1995).
4. P. G. Quincey, Appl. Phys. Lett. 64, 517 (1994).
5. D. Dimos, P. Chaudhari, J. Mannhart, and F. K. LeGoues, Phys. Rev. Lett. 61, 219 (1988).
6. P. Chaudhari and S. Y. Lin, Phys. Rev. Lett. 72, 1084 (1994).
7. C. C. Tsuei, J. R. Kirtley, C. C. Chi, L. S. Yu-Jahnes, A. Gupta, T. Shaw, J. Z. Sun, and M. B. Ketchen, Phys. Rev. Lett. 73, 593 (1994).
8. J. Mannhart, H. Hilgenkamp, B. Mayer, Ch. Gerber, J. R. Kirley, K. A. Moler, and M. Sigrist, Phys. Rev. Lett. 77, 2782 (1996).
9. J. H. Miller, Jr., Q. Y. Ying, Z. G. Zou, N. Q. Fan, J. H. Xu, M. F. Davis, and J. C. Wolfe, Phys. Rev. Lett. 74, 2347 (1995).
10. E. B. McDaniel, S. C. Gausepohl, C.-T. Li, M. Lee, J. W. P. Hsu, R. A. Rao, and C. B. Eom, Appl. Phys. Lett. 70, 1882 (1997).
11. Q. D. Jiang, X. Q. Pan, and J. Zegenhagen, Phys. Rev. B 56, 6947 (1997).
12. V. Ravikumar and V. P. Dravid, Ultramicroscopy 52, 557 (1993).
13. Due to finite size of SPM tips, the depths given here are the lower limit.
14. X. Q. Pan (private communication).
15. For example, the accuracy of crystal orientation alignment using conventional techniques, such as Laue x-ray diffraction, is ∼0.1°.