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Volumn 27, Issue 2, 1999, Pages 113-129

Generating new benchmark designs using a multi-terminal net model

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED LOGIC DESIGN; INTEGRATED CIRCUIT LAYOUT;

EID: 0032682999     PISSN: 01679260     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9260(99)00002-4     Document Type: Article
Times cited : (15)

References (17)
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  • 3
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    • Synthesis of wiring signature-invariant equivalence class circuit mutants and applications to benchmarking
    • IEEE Computer Society, February
    • D. Ghosh, N. Kapur, J. Harlow III, F. Brglez, Synthesis of wiring signature-invariant equivalence class circuit mutants and applications to benchmarking, in: Proceedings of the Design, Automation end Test in Europe Conference, IEEE Computer Society, February 1998, pp. 656-663.
    • (1998) In: Proceedings of the Design, Automation End Test in Europe Conference , pp. 656-663
    • Ghosh, D.1    Kapur, N.2    Harlow J. III3    Brglez, F.4
  • 5
    • 0015206785 scopus 로고
    • On a pin versus block relationship for partitions of logic graphs
    • Landman B.S., Russo R.L. On a pin versus block relationship for partitions of logic graphs. IEEE Trans. Comput. C-20:1971;1469-1479.
    • (1971) IEEE Trans. Comput. , vol.C-20 , pp. 1469-1479
    • Landman, B.S.1    Russo, R.L.2
  • 6
    • 0025388676 scopus 로고
    • Recent advances in VLSI layout
    • E.S. Kuh, T. Ohtsuki, Recent advances in VLSI layout, Proceedings of the IEEE, Vol. 78, 1990, pp. 237-263.
    • (1990) Proceedings of the IEEE , vol.78 , pp. 237-263
    • Kuh, E.S.1    Ohtsuki, T.2
  • 7
    • 0031673410 scopus 로고    scopus 로고
    • On the characterization of multi-point nets in electronic designs
    • in: M.A. Bayoumi, G. Jullien (Eds.), IEEE Computer Society Press, February
    • D. Stroobandt, F.J. Kurdahi, On the characterization of multi-point nets in electronic designs, in: M.A. Bayoumi, G. Jullien (Eds.), Proceedings of the 8th Great Lakes Symposium on VLSI, IEEE Computer Society Press, February 1998, pp. 344-350.
    • (1998) Proceedings of the 8th Great Lakes Symposium on VLSI , pp. 344-350
    • Stroobandt, D.1    Kurdahi, F.J.2
  • 8
    • 0345000385 scopus 로고    scopus 로고
    • Generating new benchmark designs for evaluation of CAD tools and new computer architectures
    • Technical Report, University of Ghent, April
    • D. Stroobandt, Generating new benchmark designs for evaluation of CAD tools and new computer architectures, Technical Report, University of Ghent, April 1998, ELIS Tech. Rep. DG 98-05.
    • (1998) ELIS Tech. Rep. DG 98-05
    • Stroobandt, D.1
  • 9
    • 0015299641 scopus 로고
    • On the tradeoff between logic performance and circuit-to-pin ratio for LSI
    • Russo R.L. On the tradeoff between logic performance and circuit-to-pin ratio for LSI. IEEE Trans. Comput. C-21:1972;147-153.
    • (1972) IEEE Trans. Comput. , vol.C-21 , pp. 147-153
    • Russo, R.L.1
  • 10
    • 0024913805 scopus 로고    scopus 로고
    • May Distributed on tape to participants of the Special Session on Sequential Test Generation, International Symposium on Circuits and Systems
    • F. Brglez, D. Bryan, K. Kozminski, ISCAS'89 benchmarks, May 1989. Distributed on tape to participants of the Special Session on Sequential Test Generation, International Symposium on Circuits and Systems; partially characterized, in: F. Brglez, D. Bryan, K. Kozminski, Combinational Profiles of Sequential Benchmark Circuits, Proceedings of IEEE International Symposium on Circuits and Systems, pp. 1929-1934.
    • (1989) ISCAS'89 Benchmarks
    • Brglez, F.1    Bryan, D.2    Kozminski, K.3
  • 11
    • 0024913805 scopus 로고    scopus 로고
    • Combinational Profiles of Sequential Benchmark Circuits
    • partially characterized, in
    • F. Brglez, D. Bryan, K. Kozminski, ISCAS'89 benchmarks, May 1989. Distributed on tape to participants of the Special Session on Sequential Test Generation, International Symposium on Circuits and Systems; partially characterized, in: F. Brglez, D. Bryan, K. Kozminski, Combinational Profiles of Sequential Benchmark Circuits, Proceedings of IEEE International Symposium on Circuits and Systems, pp. 1929-1934.
    • Proceedings of IEEE International Symposium on Circuits and Systems , pp. 1929-1934
    • Brglez, F.1    Bryan, D.2    Kozminski, K.3
  • 14
    • 0030411016 scopus 로고    scopus 로고
    • Hierarchical test generation with built-in fault diagnosis
    • in: M.E. Kavanaugh (Ed.), IEEE Computer Society Press, November
    • D. Stroobandt, J. Van Campenhout, Hierarchical test generation with built-in fault diagnosis, in: M.E. Kavanaugh (Ed.), Proceedings of the fifth Asian Test Symposium, IEEE Computer Society Press, November 1996, pp. 22-28.
    • (1996) Proceedings of the Fifth Asian Test Symposium , pp. 22-28
    • Stroobandt, D.1    Van Campenhout, J.2
  • 15
    • 85031620769 scopus 로고
    • June Distributed on tape to participants of the Special Session on ATPG and Fault Simulation, International Symposium on Circuits and Systems
    • F. Brglez, H. Fujiwara, A neutral netlist of 10 combinational benchmark circuits and a target translator in Fortran, June 1985, Distributed on tape to participants of the Special Session on ATPG and Fault Simulation, International Symposium on Circuits and Systems; partially characterized, in: F. Brglez, P. Pownall, R. Hum, Accelerated ATPG and Fault Grading via Testability Analysis, Proceedings of IEEE International Symposium on Circuits and Systems, pp. 695-698.
    • (1985) A Neutral Netlist of 10 Combinational Benchmark Circuits and a Target Translator in Fortran
    • Brglez, F.1    Fujiwara, H.2
  • 16
    • 0022327141 scopus 로고    scopus 로고
    • Accelerated ATPG and Fault Grading via Testability Analysis
    • partially characterized, in
    • F. Brglez, H. Fujiwara, A neutral netlist of 10 combinational benchmark circuits and a target translator in Fortran, June 1985, Distributed on tape to participants of the Special Session on ATPG and Fault Simulation, International Symposium on Circuits and Systems; partially characterized, in: F. Brglez, P. Pownall, R. Hum, Accelerated ATPG and Fault Grading via Testability Analysis, Proceedings of IEEE International Symposium on Circuits and Systems, pp. 695-698.
    • Proceedings of IEEE International Symposium on Circuits and Systems , pp. 695-698
    • Brglez, F.1    Pownall, P.2    Hum, R.3
  • 17
    • 85031619389 scopus 로고    scopus 로고
    • C. Alpert, http: // vlsicad.cs.ucla.edu/ ̃ cheese/benchmarks.html.
    • Alpert, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.