Synthesis of wiring signature-invariant equivalence class circuit mutants and applications to benchmarking

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 1998, Pages 656-663

  Ghosh, Debabrata ^a   Kapur, Nevin ^a   Harlow III, Justin ^b   Brglez, Franc ^a  

^a North Carolina State University   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

Benchmarking; Circuit mutants; Equivalence class; Signature invariance

Indexed keywords

BIPARTITE GRAPHS; CANONICAL FORM; RANDOM SELECTION; REFERENCE CIRCUITS; SIGNATURE-INVARIANCE; SYNTHESIS PROCESS; USEFUL PROPERTIES;

BENCHMARKING;

EQUIVALENCE CLASSES;

EID: 0009973892     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1998.655928     Document Type: Conference Paper

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