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Volumn 9, Issue 2 PART 3, 1999, Pages 4115-4118

A variable temperature scanning SQUID microscope

Author keywords

[No Author keywords available]

Indexed keywords

CRYOSTATS; IMAGE SENSORS; IMAGING SYSTEMS; MICROSCOPES; OPTICAL PUMPING; SCANNING; TEMPERATURE;

EID: 0032677566     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783931     Document Type: Article
Times cited : (10)

References (9)
  • 1
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    • vol. 61, pp. 598-600, 1992.
    • A. Mathai, D. Song, Y. Gim, and F. C. Wellstood, "One-dimensional magnetic-flux microscope based on the dc superconducting quantum interference device," Appl. Phys. Lett., vol. 61, pp. 598-600, 1992.
    • Appl. Phys. Lett.
    • Mathai, A.1    Song, D.2    Gim, Y.3    Wellstood, F.C.4
  • 5
    • 0028698239 scopus 로고    scopus 로고
    • "Magnetic microscope based on ybco bicrystal thin-film dc squid operating at 77-k,"
    • vol. 34, pp. 883-886, 1994.
    • S. A. Gudoshnikov, I. I. Vengrus, K. E. Andreev, and O. V. Snigirev, "Magnetic microscope based on ybco bicrystal thin-film dc squid operating at 77-k," Cryogenics, vol. 34, pp. 883-886, 1994.
    • Cryogenics
    • Gudoshnikov, S.A.1    Vengrus, I.I.2    Andreev, K.E.3    Snigirev, O.V.4
  • 6
    • 0030381655 scopus 로고    scopus 로고
    • "Hightransition temperature superconducting quantum interference device microscope,"
    • vol.67, pp. 4208-4215, 1996.
    • T. S. Lee, E. Dantsker, and J. Clarke, "Hightransition temperature superconducting quantum interference device microscope," Rev. of Sei. Instr., vol.67, pp. 4208-4215, 1996.
    • Rev. of Sei. Instr.
    • Lee, T.S.1    Dantsker, E.2    Clarke, J.3
  • 7
    • 0001670005 scopus 로고    scopus 로고
    • "Improved step edges on LaAlU3 substrates by using amorphous-carbon etch masks,"
    • vol. 65, pp. 1177-1179, 1994.
    • H. R. Yi, Z. G. Ivanov, D. Winkler et al., "Improved step edges on LaAlU3 substrates by using amorphous-carbon etch masks," Appl. Phys. Lett., vol. 65, pp. 1177-1179, 1994.
    • Appl. Phys. Lett.
    • Yi, H.R.1    Ivanov, Z.G.2    Winkler, D.3
  • 8
    • 0031647855 scopus 로고    scopus 로고
    • 'Transport and structural properties of the top and bottom grain boundaries in YBa2Cu3O7§ step-edge Josephson junctions,"
    • vol. 72 (2), pp. 249251, 1998.
    • F. Lombard! , Z. G. Ivanov et al, 'Transport and structural properties of the top and bottom grain boundaries in YBa2Cu3O7§ step-edge Josephson junctions," Appl. Phys. Lett, vol. 72 (2), pp. 249251, 1998.
    • Appl. Phys. Lett
    • Lombard, F.1    Ivanov, Z.G.2
  • 9
    • 33747745802 scopus 로고    scopus 로고
    • LabVIEW and IMAQ are trademarks of National Instruments Corporation.
    • LabVIEW and IMAQ are trademarks of National Instruments Corporation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.