Design and applications of a scanning SQUID microscope

IBM Journal of Research and Development

Volumn 39, Issue 6, 1995, Pages 655-667

  Kirtley, J R ^a   Ketchen, M B ^a   Tsuei, C C ^a   Sun, J Z ^a   Gallagher, W J ^a   Yu Jahnes, Lock See ^a   Gupta, A ^a   Stawiasz, K G ^a   Wind, S J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FIELD MEASUREMENT; MAGNETOMETERS; MICROSCOPES; OXIDE SUPERCONDUCTORS; SENSORS; SUPERCONDUCTING FILMS; YTTRIUM COMPOUNDS;

HALF INTEGER FLUX QUANTUM EFFECTS; SCANNING SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MICROSCOPE; YTTRIUM BARIUM COPPER OXIDE;

SQUIDS;

EID: 0029407664     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.396.0655     Document Type: Article

References (36)