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Volumn 72, Issue 2, 1998, Pages 249-251

Transport and structural properties of the top and bottom grain boundaries in YBa2Cu3O7-δ step-edge Josephson junctions

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRODES; ELECTRON BEAM LITHOGRAPHY; ETCHING; GRAIN BOUNDARIES; ION BEAMS; LANTHANUM COMPOUNDS; MASKS; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES; YTTRIUM COMPOUNDS;

EID: 0031647855     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120700     Document Type: Article
Times cited : (17)

References (13)
  • 6
    • 0009246955 scopus 로고
    • edited by H. Weinstock and R. W. Raltson, Kluwer, Dordrecht
    • A. I. Braginski, The New Superconducting Electronics, edited by H. Weinstock and R. W. Raltson, (Kluwer, Dordrecht, 1993), p. 89.
    • (1993) The New Superconducting Electronics , pp. 89
    • Braginski, A.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.