|
Volumn 72, Issue 2, 1998, Pages 249-251
|
Transport and structural properties of the top and bottom grain boundaries in YBa2Cu3O7-δ step-edge Josephson junctions
a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL MICROSTRUCTURE;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRODES;
ELECTRON BEAM LITHOGRAPHY;
ETCHING;
GRAIN BOUNDARIES;
ION BEAMS;
LANTHANUM COMPOUNDS;
MASKS;
TRANSMISSION ELECTRON MICROSCOPY;
TRANSPORT PROPERTIES;
YTTRIUM COMPOUNDS;
AMORPHOUS CARBON MASK;
ARGON ION MILLING;
MICROBRIDGE;
RESISTIVELY SHUNTED JUNCTION;
SHADOWING;
STEP EDGE JUNCTION;
JOSEPHSON JUNCTION DEVICES;
|
EID: 0031647855
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.120700 Document Type: Article |
Times cited : (17)
|
References (13)
|