Measurement of the static error rate of a storage cell for single magnetic flux quanta, fabricated from high-Tc multilayer bicrystal Josephson junctions

Applied Physics Letters

Volumn 72, Issue 12, 1998, Pages 1513-1515

  Chong, Y ^a   Ruck, B ^a   Dittmann, R ^a   Horstmann, C ^a   Engelhardt, A ^a   Wahl, G ^a   Oelze, B ^a   Sodtke, E ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CALCULATIONS; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TRANSITIONS; MATHEMATICAL MODELS; MEASUREMENT ERRORS; OPTICAL IMAGE STORAGE; QUANTUM THEORY; THERMAL NOISE;

MULTILAYER BICRYSTAL TECHNOLOGY; STATIC ERROR RATE; STORAGE CELL; THERMALLY ACTIVATED BARRIER CROSSING;

SQUIDS;

EID: 0032021584     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121043     Document Type: Article

References (12)

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