Molecular dynamics study of defect production due to low-energy collisions

Modelling and Simulation in Materials Science and Engineering

Volumn 7, Issue 4, 1999, Pages 495-502

  Finder, J M ^a,b   Richards, D F ^a   Adams, J B ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COOLING; CRYSTAL DEFECTS; CRYSTALLOGRAPHY; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; SINGLE CRYSTALS; THERMAL EFFECTS;

KINCHIN-PEASE MODEL;

SILICON WAFERS;

EID: 0032670092     PISSN: 09650393     EISSN: None     Source Type: Journal    
DOI: 10.1088/0965-0393/7/4/302     Document Type: Article

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