Location Of Low-Frequency Noise Sources In Submicrometer Bipolar Transistors

IEEE Transactions on Electron Devices

Volumn 39, Issue 6, 1992, Pages 1501-1506

  Kleinpenning, Theo G M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000043813     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.137332     Document Type: Article

References (12)

1. T. G. M. Kleinpenning, “1/f noise in electronic devices,” in Noise in Physical Systems, A. Ambrozy, Ed. Budapest, Hungary: Aka demiai Kiado, 1990, p. 443.
2. A. van der Ziel, “Unified presentation of 1//noise in electronic Devices: Fundamental 1/f noise sources,” Proc. IEEE, vol. 76, p. 233, 1988.
3. A. van der Ziel, X. Zhang, and A. H. Pawlikiewicz, “Location of 1/f noise sources in BJT’s and HBJT’s—I. Theory,” IEEE Trans. Electron Devices, vol. ED-33, p. 1371, 1986.
4. T. G. M. Kleinpenning, “On 1/f mobility fluctuations in bipolar transistors,” Physica, vol. 138B, p. 244, 1986.
5. M. N. Tutt, D. Pavlidis, and B. Bayraktaroglu, “An assessment of noise sources and characteristics of AlGaAs/GaAs heterojunction bipolar transistors,” Inst. Phys. Conf. Ser. No. 106, IOP Publishing Ltd., 1990, p. 701.
6. H. C. de Graaff and F. M. Klaassen, Compact Transistor Modelling for Circuit Design. Vienna, Austria: Springer-Verlag, 1990.
7. F. N. Hooge, T. G. M. Kleinpenning, and L. K. J. Vandamme, “Experimental studies on 1/f noise,” Rep. Progr. Phys., vol. 44, pp. 479, 1981.
8. J. L. Plumb and E. R. Chenette, “Flicker noise in transistors,” IEEE Trans. Electron Devices, vol. ED-10, p. 304, 1963.
9. T. G. M. Kleinpenning, “1/f mobility fluctuations in p-i-n and p-γ-n diodes,” Physica, vol. 154B, p. 27, 1988.
10. L. B. Kiss and T. G. M. Kleinpenning, “On I//noise in collector current of bipolar transistors,” Physica, vol. 145B, p. 181, 1987.
11. J. Kilmer, A. van derZiel, and G. Bosman, “Presence of mobility-fluctuation 1/f noise identified in silicon p + np transistors,” Solid-State Electron., vol. 26, p. 71, 1983.
12. T. G. M. Kleinpenning and A. J. Holden, “1/f noise and RTS noise in submicron BJT’s,” in Noise in Physical Systems and 1/f Fluctuations, T. Musha, Ed. Kyoto, Japan: Ohmasha, Ltd., 1991, p. 435.