AC electrical characterization of the solid-state reaction derived CaSnO3

Journal of Materials Science

Volumn 34, Issue 14, 1999, Pages 3375-3396

  Azad, Abdul Majeed ^a   Shyan, Lucia Liew Woan ^a   Alim, Mohammad A ^b  

^a UNIVERSITY PUTRA MALAYSIA   (Malaysia)

^b ALABAMA A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CERAMIC CAPACITORS; CRYSTAL MICROSTRUCTURE; ELECTRIC PROPERTIES; GRAIN BOUNDARIES; RELAXATION PROCESSES; SINTERING; SPECTROSCOPY; TEMPERATURE;

AC SMALL SIGNAL MEASUREMENT; CALCIUM TIN OXIDE; SOLID STATE REACTION;

CALCIUM COMPOUNDS;

EID: 0032663367     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004633132169     Document Type: Article

References (23)

1. R. BUCHANAN, "Ceramic Materials for Electronics" (Marcel Dekker, New York 1986); A. J. MOULSON and J. M. HERBERT, "Electroceramics: Materials, Processing, Applications" (Chapman and Hall, New York, 1990).
2. R. BUCHANAN, "Ceramic Materials for Electronics" (Marcel Dekker, New York 1986); A. J. MOULSON and J. M. HERBERT, "Electroceramics: Materials, Processing, Applications" (Chapman and Hall, New York, 1990).
3. Y. SHIMIZU, M. SHIMABUKURO, H. ARAI and T. SEIYAMA, J. Electrochem. Soc. 136 (1989) 1206; P. T. MOSELEY, A. M. STONEHAM and D. E. WILLIAMS, in "Techniques and Mechanisms in Gas Sensing," edited by P. T. Moseley, J. O. W. Norris and D. E. Williams (Adam Hilger, Bristol, 1991) chap. 4.
4. Y. SHIMIZU, M. SHIMABUKURO, H. ARAI and T. SEIYAMA, J. Electrochem. Soc. 136 (1989) 1206; P. T. MOSELEY, A. M. STONEHAM and D. E. WILLIAMS, in "Techniques and Mechanisms in Gas Sensing," edited by P. T. Moseley, J. O. W. Norris and D. E. Williams (Adam Hilger, Bristol, 1991) chap. 4.
5. U. LUMPE, J. GERBLINGER and H. MEIXNER, Sensors and Actuators B 26-27 (1995) 97.
6. J. M. HERBERT, "Ceramic Dielectrics and Capacitors" (Gordon and Breach Science Publishers, Philadelphia, 1985).
7. A.-M. AZAD, in Proc. 5th International Symposium on Advanced Materials, Islamabad, Pakistan, edited by M. A. Khan, A. Haq, K. Hussain and A. Q. Khan (Dr. A. Q. Khan Research Laboratories, Kahuta, Pakistan, 1997) pp. 110-117.
8. A.-M. AZAD, L. L. W. SHYAN and P. T. YEN, J. Alloys Comp. 282 (1999) 109.
9. A.-M. AZAD and N. C. HON, ibid. (1998) 270 (1998) 95.
10. O. PARKASH, K. D. MANDAL, C. C. CHRISTOPHER, M. S. SASTRY and D. KUMAR, J. Mater. Sci. Lett. 13 (1994) 1616.
11. K. D. MANDAL, M. S. SASTRY and O. PARKASH, ibid. 14 (1995) 1412.
12. S. UPADHYAY, O. PARKASH and D. KUMAR, ibid. 16 (1997) 1330.
13. A.-M. AZAD, L. B. YOUNKMAN, S. A. AKBAR and M. A. ALIM, J. Amer. Ceram. Soc. 77 (1994) 3145.
14. V. D. PATTON, C. C. WANG, S. A. AKBAR and M. A. ALIM, J. Appl. Phys. 78 (1995) 1757.
15. M. A. ALIM, Act. Pass. Electron. Comp. 19 (1996) 139.
16. M. A. ALIM, M. A. SEITZ and R. W. HIRTHE, J. Appl. Phys. 63 (1988) 2337.
17. M. A. ALIM, S. KHANAM and M. A. SEITZ, Act. Pass. Electron. Comp. 16 (1994) 153.
18. M. A. ALIM, Materials Research Society Proceedings: Electrically-Based Microstructural Characterization 411 (1996) 13.
19. A.-M. AZAD, L. L. W. SHYAN and M. A. ALIM, J. Mater. Sci. 34 (1999) 3375.
20. M. A. ALIM and S. A. AKBAR, "Immittance Data Acquisition and Analytical Software Package," Developed at The Ohio State University, Columbus, OH, 1992.
21. M. A. ALIM, Materials Research Society Proceedings: Electrically-Based Microstructural Characterization 411 (1996) 113.
22. L. C. SLETSON, M. E. POTTER and M. A. ALIM, J. Amer. Ceram. Soc. 71 (1988) 909.
23. M. A. SEITZ, Int. J. Hybr. Microelectron. 3 (1980) 1.