Phenomena related to concurrent multiple complex plane representations of the immittance data

Materials Research Society Symposium - Proceedings

Volumn 411, Issue , 1996, Pages 113-125

  Alim, Mohammad A ^a  

^a Hubbell Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC IMPEDANCE MEASUREMENT; EQUIVALENT CIRCUITS;

CONCURRENT MULTIPLE COMPLEX PLANE DATA REPRESENTATION; HETEROGENOUS SYSTEMS; IMMITTANCE DATA; MULTIPLE SEMICIRCULAR RELAXATION; OPERATIVE PHENOMENA; SINGLE SEMICIRCULAR RELAXATION;

SPECTROSCOPY;

EID: 0029727085     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)