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Volumn 411, Issue , 1996, Pages 13-23
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Immittance data-handling/analyzing criteria for heterogeneous systems
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
DATA HANDLING;
DATA REDUCTION;
ELECTRIC IMPEDANCE MEASUREMENT;
ELECTRONIC EQUIPMENT TESTING;
POLYCRYSTALLINE MATERIALS;
ELECTRICAL PATHS;
HETEROGENEOUS SYSTEMS;
IMMITTANCE DATA ANALYZING;
IMMITTANCE DATA HANDLING;
NORMALIZATION PROCEDURE;
OPERATIVE PHENOMENA;
SINGLE CRYSTAL SINGLE JUNCTION (SCSJ) TECHNOLOGY;
ELECTRIC IMPEDANCE;
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EID: 0029767157
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (12)
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References (7)
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