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Journal of Materials Research

Volumn 14, Issue 6, 1999, Pages 2399-2401

Cross-sectional observation on the indentation of [001] silicon

(3) Wu, Y Q a Shi, G Y b Xu, Y B a

a INSTITUTE OF METAL RESEARCH (China)

b University of Liaoning (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; HARDNESS; STRESSES; SURFACES; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

ELASTOPLASTIC THEORY; HYDROSTATIC STRESS; NONDIFFRACTION CONTRAST; VICKERS INDENTATION;

AMORPHOUS SILICON;

EID: 0032650770 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.1999.0322 Document Type: Article

Times cited : (10)

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