Phase-retrieval X-ray diffractometry in the case of high- or low-flux radiation source

Physica Status Solidi (A) Applied Research

Volumn 172, Issue 2, 1999, Pages 291-301

  Nikulin, A Yu ^a   Zaumseil, P ^b  

^a MONASH UNIVERSITY   (Australia)

^b Institute of Semiconductor Physics   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; NUMERICAL METHODS; POINT DEFECTS; STRAIN;

BRAGG DIFFRACTION; PHASE RECONSTRUCTION; PHASE-RETRIEVAL X RAY DIFFRACTOMETRY;

X RAY CRYSTALLOGRAPHY;

EID: 0032640621     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199904)172:2<291::AID-PSSA291>3.0.CO;2-P     Document Type: Article

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