Model-independent determination of the strain distribution for /Si superlattice using x-ray diffractometry data

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 13, 1996, Pages 8277-8282

  Nikulin, A Yu ^a   Stevenson, A ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000933996     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.8277     Document Type: Article

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