VUV-ellipsometry on BexZn1-xSe and BeTe

Journal of Electronic Materials

Volumn 28, Issue 6, 1999, Pages 670-677

  Wilmers, K ^a,b   Wethkamp, T ^a,b   Esser, N ^a   Cobet, C ^a   Richter, W ^a   Wagner, V ^c   Lugauer, H ^c   Fischer, F ^c   Gerhard, T ^c   Keim, M ^c   Cardona, M ^b  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^c UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BERYLLIUM COMPOUNDS; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRON TRANSITIONS; ELLIPSOMETRY; ENERGY GAP; SPECTROSCOPIC ANALYSIS; ULTRAVIOLET RADIATION; VACUUM;

VACUUM ULTRAVIOLET (VUV) ELLIPSOMETRY;

SEMICONDUCTOR MATERIALS;

EID: 0032639367     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-999-0052-8     Document Type: Article

References (32)

1. G. Landwehr, F. Fischer, T. Baron, T. Litz, A. Waag, K. Schüll, H. Lugauer, T. Gerhard, M. Keim and U. Lunz, Phys. Stat. Sol. B 202, 645 (1997).
2. A. Waag, F. Fischer, H.-J. Lugauer, Th. Litz, T. Gerhard, J. Nürnberger, U. Lunz, U. Zehnder, W. Ossau, G. Landwehr, B. Roos and H. Richter, Mater. Sci. Eng. B 43, 65 (1997).
3. Th. Litz, H.-J. Lugauer, F. Fischer, U. Zehnder, U. Lunz, Th. Gerhard, H. Ress, A. Waag and G. Landwehr, Mater. Sci. Eng. B 43, 83 (1997).
4. A. Waag, F. Fischer, K. Schüll, T. Baron, H.-J. Lugauer, T. Litz, U. Zehnder, W. Ossau, T. Gerhard, M. Keim, G. Reuscher and G. Landwehr, Appl. Phys. Lett. 70 280 (1997).
5. V. Bousquet, E. Tournie, M. Laugt, P. Vennegues and J. P. Faurie, Appl. Phys. Lett. 70, 3564 (1997).
6. D.E. Aspnes, Opt. Commun. 8, 222 (1973).
7. R.M.A. Azzam and N.M. Bashara, Ellipsometry and Polarized Light, (Amsterdam: North Holland, 1977).
8. A. Fleszar, to be published (1998).
9. R.L. Johnson, J. Barth, M. Cardona, D. Fuchs and A.M. Bradshaw, Rev. Sci. Instrum. 60, 2209 (1989).
10. J. Barth, R.L. Johnson and M. Cardona, Handbook of Optical Constants of Solids II, ed. by E. Palik, (New York: Academic Press, 1991).
11. T. Wethkamp, K. Wilmers, N. Esser, W. Richter, O. Ambacher, H. Angerer, G. Jungk, R.L. Johnson and M. Cardona, Thin Solid Films 313-314, 745 (1998).
12. M. Nagelstraßer, H. Dröge, F. Fischer, T. Litz, A. Waag, G. Landwehr, A. Fleszar, W. Hanke and H.-P. Steinrück, in print, Phys. Rev. B (October 15, 1998).
13. R.G. Dandrea and C.B. Duke, Appl. Phys. Lett. 64, 2145 (1994).
14. A. Waag, F. Fischer, H.-J. Lugauer, Th. Litz, J. Laubender, U. Lunz, U. Zehnder, W. Ossau, T. Gerhard, M. Möller and G. Landwohr, J. Appl. Phys. 80, 792 (1996).
15. M. Cardona, J. Appl. Phys. (Suppl.) 32, 2151 (1961).
16. M. Aven, D.T.F. Marple and B. Segall, J. Appl. Phys. (Suppl.) 32, 2261 (1961).
17. M. Cardona and G. Harbeke, J. Appl. Phys. 34, 813 (1963).
18. F.H. Pollak, II-VI-Semiconductors, ed. D.G. Thomas, (New York: Benjamin, 1967), p. 552.
19. J.L. Freeouf, Phys. Rev. B 7, 3810 (1973).
20. J.P. Walter, M.L. Cohen, Y. Petroff and M. Balkanski, Phys. Rev. B 1, 2661 (1970).
21. J.R. Chelikowsky and M.L. Cohen, Phys. Rev. B14, 556 (1976).
22. S. Adachi and T. Taguchi, Phys. Rev. B 43, 9569 (1991).
23. L. Ley, R.A. Pollak, F.R. McFeely, S.P. Kowalzyk and D.A. Shirley, Phys. Rev. B 9 600 (1974).
24. S.P. Kowalczyk, L. Ley, F.R. McFeely and D.A. Shirley, J. Chem. Phys. 61, 2850 (1974).
25. W.B. Jackson and J.W. Allen, Phys. Rev. B 37, 4618 (1988).
26. S. Albrecht, L. Reining, R. Del Sole and G. Onida, Phys. Rev. Lett. 80, 4510 (1998).
27. L.X. Benedict, E.L. Shirley and R.B. Bohn, Phys. Rev. Lett. 80, 4514 (1998).
28. L. Sham and M. Schlüter, Phys. Rev. Lett. 51, 1888 (1983).
29. O. Zakharov, A. Rubio, X. Blase, M.L. Cohen and S.G. Louie, Phys. Rev. B 50, 10780 (1994).
30. M. Cardona, Phys. Rev. 129, 1068 (1963).
31. M. Cardona, N.E. Christensen and G. Fasol, Phys. Rev. B 38, 1806-1827 (1988).
32. M. Cardona and R. Haensel, Phys. Rev. B 1, 2605 (1970).