Room temperature operated single electron transistor made by a scanning tunnelling microscopy/atomic force microscopy nano-oxidation process

International Journal of Electronics

Volumn 86, Issue 5, 1999, Pages 641-662

  Matsumoto, Kazuhiko ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; CATHODES; ENERGY GAP; OXIDATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR DEVICE MANUFACTURE; SUBSTRATES;

SINGLE ELECTRON TRANSISTORS (SET);

TRANSISTORS;

EID: 0032639283     PISSN: 00207217     EISSN: 13623060     Source Type: Journal    
DOI: 10.1080/002072199133292     Document Type: Article

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