Field emission interferometry with the scanning tunneling microscope

Surface Science

Volumn 426, Issue 1, 1999, Pages

  Caamano A J ^a   Pogorelov, Y ^b   Custance, O ^a   Mendez J ^a   Baro A M ^a   Veuillen, J Y ^c   Gomez Rodriguez J M ^a   Saenz J J ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b UNIVERSITY OF PORTO   (Portugal)

^c LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ELECTRON SCATTERING; INTERFEROMETRY; IONIZATION; LEAD; LOW ENERGY ELECTRON DIFFRACTION; MATHEMATICAL MODELS; SCANNING TUNNELING MICROSCOPY; SILICON; SPECTRUM ANALYSIS;

FIELD EMISSION INTERFEROMETRY;

SURFACE PHENOMENA;

EID: 0032638703     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00346-5     Document Type: Article

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