Analyses of petrified wood by electron, X-ray and optical microprobes

Journal of analytical atomic spectrometry

Volumn 14, Issue 3, 1999, Pages 435-446

  Kuczumow, Andrzej ^a   Vekemans, Bart ^b   Schalm, Olivier ^b   Dorriné, Walter ^b   Chevallier, Pierre ^c   Dillmann, Philippe ^c   Ro, Chul Un ^d   Janssens, Koen ^b   Van Grieken, René ^b  

^a MARIA CURIE SK ODOWSKA UNIVERSITY   (Poland)

^b UNIVERSITY OF ANTWERP   (Belgium)

^c UNIVERSITÉ PARIS SUD   (France)

^d Hallym University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; MICROANALYSIS; OPTICAL MICROSCOPY; POLYCRYSTALLINE MATERIALS; QUARTZ; RAYLEIGH SCATTERING; SILICA; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

ELECTRON MICROPROBE ANALYSIS; PETRIFIED WOOD; SYNCHROTRON CAPILLARY X RAY MICROPROBE ANALYSIS; X RAY FLUORESCENCE MICROPROBE ANALYSIS;

WOOD;

EID: 0032638096     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a806748a     Document Type: Article

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